• Experience the research world—for many undergraduates this is a first!
• Share research results and exchange ideas with other students, judges, and conference attendees.
• Rub shoulders with academic and industry luminaries.
• Understand the practical applications of their research.
This workshop provides a forum to discuss current practices as well as near-future research aimed at addressing the ever-growing problems of variability/reliability and their impact on design performance and cost. The scope of the workshop further covers the detailed technical aspects of variability/reliability characterization, including compact modeling, stochastic simulation, test structure design, statistical CAD, and resilient design. The workshop also provides an opportunity to discuss modeling and characterization needs for emerging device technologies.