This workshop provides a forum to discuss current practice as well as near future research needs in the long-term trend of variability/reliability and their impact on design performance and cost, as well as detailed technical aspects of variability/reliability characterization, compact modeling, statistical simulation, test structure design, CAD, as well as resilient design. The workshop also provides an opportunity to discuss emerging modeling and characterization needs in emerging devices. The following are the key areas that will be covered.
Machine learning algorithms, such as those for image based search, face recognition, multi-category classification, and scene analysis, are being developed that will fundamentally alter the way individuals and organizations live, work, and interact with each other. However, their computational complexity still challenges the state-of-the-art computing platforms, especially when the application of interest is tightly constrained by the requirements of low power, high throughput, small latency, etc.