MONDAY November 10, 4:00pm - 5:30pm | Cedar Ballroom
SESSION 3D
REGULAR SESSION: Modeling and Simulation of Process Variability
Subarna Sinha - Synopsys, Inc., Menlo Park, CA
Variation modeling is an essential bridge between the underlying technology and robust design practice. This session presents four papers that address statistical modeling and simulation of emerging variability mechanisms in scaled CMOS design, including those related to the implementation of metal gates, random dopant fluctuations, and non-rectangular gates. Analysis at both device and circuit levels is explored to efficiently handle variations.
* indicates Best Paper Candidate
SESSION 3D
REGULAR SESSION: Modeling and Simulation of Process Variability
Moderators:
Eric Keiter - Sandia National Labs, Albuquerque, NMSubarna Sinha - Synopsys, Inc., Menlo Park, CA
Variation modeling is an essential bridge between the underlying technology and robust design practice. This session presents four papers that address statistical modeling and simulation of emerging variability mechanisms in scaled CMOS design, including those related to the implementation of metal gates, random dopant fluctuations, and non-rectangular gates. Analysis at both device and circuit levels is explored to efficiently handle variations.
| 3D.1* | Statistical Modeling of Metal-gate Work-function Variability in Emerging Device Technologies and Implications for Circuit Design | |
| Speaker: | Hamed Dadgour - Univ. of California, Santa Barbara, CA |
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| Authors: | Hamed Dadgour - Univ. of California, Santa Barbara, CA Vivek De - Intel Corp., Hillsboro, OR Kaustav Banerjee - Univ. of California, Santa Barbara, CA |
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| 3D.2 | Large-scale Atomistic Approach to Random-dopant-Induced Characteristic Variability in Nanoscale CMOS Digital and High-frequency Integrated Circuits | |
| Speaker: | Chih-Hong Hwang - National Chiao Tung Univ., Hsinchu, Taiwan |
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| Authors: | Yiming Li - National Chiao Tung Univ., Hsinchu, Taiwan Chih-Hong Hwang - National Chiao Tung Univ., Hsinchu, Taiwan Ta-Ching Yeh - National Chiao Tung Univ., Hsinchu, Taiwan Tien-Yeh Li - National Chiao Tung Univ., Hsinchu, Taiwan |
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| 3D.3s | A New Method to Improve Accuracy of Leakage Current Estimation for Transistors with Non-rectangular Gates due to Sub-wavelength Lithography Effects | |
| Speaker: | Kuen-Yu Tsai - National Taiwan Univ., Taipei, Taiwan |
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| Authors: | Kuen-Yu Tsai - National Taiwan Univ., Taipei, Taiwan Meng-Fu You - National Taiwan Univ., Taipei, Taiwan Yi-Chang Lu - National Taiwan Univ., Taipei, Taiwan Philip C.W. Ng - National Taiwan Univ., Taipei, Taiwan |
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| 3D.4s | Linear Analysis of Random Process Variability | |
| Speaker: | Victoria Wang - Univ. of California, Los Angeles, CA |
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| Authors: | Victoria Wang - Univ. of California, Los Angeles, CA Dejan Marković - Univ. of California, Los Angeles, CA |
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* indicates Best Paper Candidate
